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Four Probe Method

Name: Four Probe Method
Brand: GUPTA INSTRUMENTS CO
Price: 4500.0 INR
Availability: InStock

Price 4500.0 INR/ Piece

Get a Price/Quote

MOQ : 50 Pieces

Four Probe Method Specification

Frequency
50 Hz

Temperature Range
Ambient to 200C

Automation Grade
Manual

Core Components
Probe Assembly, Oven, Measurement Unit

Measurement Range
0.1 m to 200 k

Power Source
220V AC mains

Voltage
220 V

Capacity
1 Sample per setup

Feature
High accuracy, Compact Design, Easy-to-operate panel

Model No
FP-200

Accuracy
1% of reading

Equipment Materials
Mild Steel Body with Powder Coating, Stainless Steel Probes

Type
Laboratory Apparatus

Usage
Resistivity and conductivity measurement of semiconductors

Display Type
Digital

Dimension (L*W*H)
220 mm x 175 mm x 140 mm

Weight
7 kg (approx.)

Cooling System
Natural air cooling

Heating System
Cartridge heater integrated

Oven Control
Digital temperature controller with sensor

Compliance
CE Marked

Operating Environment
Indoor, dust-free, temperature controlled laboratory

Probe Spacing
1 mm (fixed)

Number of Probes
4 (collinear arrangement)

Sample Placement
Spring-loaded

Readout
Direct digital meter for voltage and current

Max Sample Size
10 mm x 10 mm

Four Probe Method Trade Information

Minimum Order Quantity
50 Pieces

Delivery Time
5-7 Days

About Four Probe Method

FOUR PROBE METHOD APPARATUS

The Four Probe Method Apparatus is a precision laboratory instrument used for measuring the electrical resistivity and conductivity of semiconductor materials. It is widely utilized in physics laboratories, research institutions, engineering colleges, and material science studies for accurate characterization of conductive and semiconductor samples.

FEATURES

High accuracy measurement system

Digital display for precise readings

Stable current source

Reliable probe arrangement

Durable laboratory construction

Easy operation and calibration

APPLICATIONS

Semiconductor research

Physics laboratories

Material science studies

Engineering institutions

Educational demonstrations

BENEFITS

Provides accurate resistivity measurements

Supports advanced material analysis

Enhances practical laboratory learning

Reliable and repeatable results

Suitable for research and educational applications

Precise Semiconductor Characterization

The Four Probe Method apparatus (FP-200) offers a highly accurate solution for measuring the resistivity and conductivity of small semiconductor samples. Its collinear four-probe system with 1 mm spacing ensures reliable results, while integrated digital temperature control enables testing across a wide thermal range for comprehensive material analysis.

Thoughtful Design for Laboratory Use

Compact yet robust, the FP-200 features a powder-coated mild steel body and stainless steel probes for durability. The unit's spring-loaded sample placement, intuitive digital readout, and handy digital temperature controller simplify operation, while the manual automation grade allows direct user supervision during measurements.

Reliable Results with Advanced Features

This apparatus incorporates a cartridge heating system and natural air cooling for consistent sample conditioning. CE compliance, high-precision readings, and easy-to-operate controls position the FP-200 as a dependable instrument for demanding laboratory environments.

FAQ's of Four Probe Method:

Q: How does the Four Probe Method apparatus measure the resistivity of semiconductor samples?

A: The apparatus utilizes four collinear probes with fixed 1 mm spacing to inject current and measure voltage across the semiconductor. The direct digital meter displays voltage and current values, from which the resistivity and conductivity are calculated based on the sample geometry and probe arrangement.

Q: What is the process for placing a sample in the FP-200 apparatus?

A: Samples, up to 10 mm x 10 mm, are positioned on the spring-loaded platform to ensure stable contact with all four stainless steel probes. This mechanism ensures uniform pressure, facilitating accurate measurements during the testing process.

Q: When should I use the digital temperature controller during an experiment?

A: The digital temperature controller is used to set and maintain the desired temperature (up to 200C) for the sample during testing. This is especially important when investigating temperature-dependent properties of semiconductors, as material behavior can vary with temperature.

Q: Where is the FP-200 best operated for optimal performance?

A: Optimal performance is achieved in an indoor, dust-free, temperature-controlled laboratory environment. Such conditions prevent contamination and ensure reliable, repeatable measurements.

Q: What are the key benefits of using the FP-200 Four Probe Method apparatus?

A: The FP-200 offers high accuracy (within 1% of reading), compact design, and user-friendly operation. Its digital readout, secure sample placement, and precise temperature control enhance measurement reliability and repeatability.

Q: How many samples can be tested at once with this apparatus?

A: The FP-200 is designed to test one sample at a time, ensuring controlled conditions and focused, accurate measurements for each specimen.

Q: What type of materials are suitable for measurement with this device?

A: This apparatus is ideal for measuring the resistivity and conductivity of small semiconductor samples within the stated dimensions. It's commonly used in research and educational laboratories for material science studies.

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